Tousimis Samdri Critical Point Dryer (requires staff time)

The Leica EM ACE600 coater uses precious metals (gold/gold-palladium primarily) for the coating of scanning electron microscopy samples for high resolution applications. It is also capable of carbon coating samples for composition analysis. It is programmable and can be set to specific coating thickness.

The Leica DVM6 is a high-resolution light microscope with 10-megapixel digital camera, integrated illumination, Z-stacking capabilities and advanced analysis software. Two objectives are available for the DVM6: the low magnification objective provides 190x magnification at long working distances, and the high magnification objective provides up to 2,350x magnification for highly-detailed work.

The FEI Teneo (FEI Co., Hillsboro, OR), a field emission scanning electron microscope (FESEM), is GEM’s analytical SEM. The Teneo has several detectors, including a segmented backscatter detector, a standard Everhart-Thornley secondary electron detector, and three in-lens secondary electron detectors. Imaging can be accomplished using an accelerating voltage of 500 V–30 kV.  The Teneo has beam deceleration capabilities, which can mitigate charging effects for non-conductive samples. It also has scanning transmission (STEM) capabilities with a resolution of 0.8 nm while operating at 30 kV, and can provide data in brightfield, darkfield, and high angle dark field modes. The Teneo is equipped with an extremely large area (150 mm Oxford XMax^N) detector for energy-dispersive spectroscopy (EDS) that provides elemental analysis and rapid elemental mapping (including boron). The Teneo also has a Deben cool stage that can maintain a temperature of ≤–25 ^oC.

STEM – Hitachi SU9000EA
• Worlds’s highest secondary electron resolution of 0.4 nm at 30 kV
• Usable magnification of up to 3,000,000x
• Superior low kV performance for observing beam sensitive samples (biological, polymers, nanomaterials)
• Integrated Electron Energy Loss Spectroscopy (EELS)
• Oxford Large Area Windowless Energy Dipersive Spectroscopy (EDS)
• Micro Electron Diffraction (micro-ED)
• Tomography

amera.

Please include the following in all manuscipts related to imaging on this system "This work used the
JEOL 2100PLUS microscope housed in UGA’s Georgia Electron Microscopy core facility that
was acquired with funding from the National Institutes of Health through grant 1S10OD034282-
01"

We have three RMC MT-X microtomes controlled by advanced microprocessors. These ultramicrotomes are capable of sectioning resin-embedded samples from 30nm thick to 5um semi-thin sections.

The Horiba XGT-5000 is an X-Ray Fluorescence (XRF) system, which utilizes the fluorescent signature of elements to determine an analyte’s composition. This particular system is ideal for large area elemental mapping analysis of samples at ambient conditions.